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![]() SELECTED PAPERS FROM: Scientific Detection of Fakery in Art II September 20-21, 1999 As a service to web users were are periodically posting papers from the syposium. The first offering is the paper "Art Fakes and The Statue of Limitations" - Alan Feld, Professor of Law Boston University, Boston, MA [Chapter 3 of this book is available for download by clicking here.] Part of SPIE's* International Symposium on Voice, Video and Communications 19-22 September 1999 Hynes Convention Center Boston, Massachusetts USA Conference Chairs: Duane R. Chartier, ConservArt Associates, Inc.; Walter McCrone, McCrone Research Institute; Richard J. Weiss, King's College This two-day conference concentrated on scientific techniques such as carbon dating, optical microscopy, x-ray fluorescence, pigment analysis, x-radiography, laser profilometry, etc. used to authenticate art. In addition the conference explored new and old methods that complement connoisseurship. A round-table discussion attempted to present state of the subject and resulted in a very levely debate. * SPIE is the International Society for Optical Engineering. These sessions were part of a much larger conference "Photonics East" that features advances in optical and electrical engineering. For more information on future meetings contact SPIE directly. Program
- List of Presentations Chapter 3 of this book is available for download by clicking here. Alan Feld Law Professor at Boston University Authenticity of Engraved Scrimshaw Donald Ridley Assistant Curator, Kendall Whaling Museum Detection of Philatelic Forgeries Mercer Bristow American Philatelic Society Director of the Expertizing Service Insurability of Art Renée Vara Chubb Insurance DNA as a Security Marker Chris Outwater DNA Technologies Inc., Los Angeles, CA Rick Tullis DNA Sciences, Carlsbad, CA Authentication at a Small Museum Douglas K. S. Hyland New Britain Museum of American Art, New Britain, CT Raman Spectroscopy in the Art World Ken P. J. Williams Renishaw PLC, Old Town, Wotton-under-Edge, Glouchestershire Lucia Burgio and Robin J. H. Clark University College London, Christopher Ingold Laboratories Fakes, Forgeries and Experts (FFE) (Philately) Paolo Vollmeier Switzerland, President of the Commission for the Fight Against Forgeries of the F.I.P Richard J. Weiss Fakebusters Non-Destructive Analysis of Artifacts Manfred Schreiner, Dubravka Jembrih, and Robert Linke Institute of Chemistry, Academy of Fine Arts, Vienna, Austria and Institute of Analytical Chemistry, Vienna University of Technology, Vienna, Austria Michael Mantler Institute of Applied and Technical Physics, Vienna University of Technology, Vienna, Austria International Center for Art Intelligence (ICAI) Duane Chartier How Appraisers Deal with Authenticity Edward N. Okil Executive Director, National Institute of Appraisers Framing and Care of Original Works of Art on Paper Edward N. Okil Executive Director, National Institute of Appraisers Fakery in Graphic Arts Howard Hansen Museum of Printing, North Andover, MA Optical Tricks to Foil Counterfeiters Originally published in OE REPORTS R. Winn Hardin Raman Spectroscopy to Solve Crime M. Claybourn Spectroscopy Products Division, Renishaw PLC, Old Town, Wotton-under Edge, Gloucestershire M. Ansell Forensic Document Examiner, Herne Bay, Kent, UK. Roundtable Discussion: All Speakers Moderator: Dr. Duane Chartier, International Center for Art Intelligence, Inc., and ConservArt Associates, Inc.
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